In-situ study of phase transition and structure of thin films: slot-die technology meets with X-ray analysis

Sign up to learn:

• How synchrotron X-ray techniques unlock detailed understanding of thin film formation for next-generation photovoltaics, batteries, and energy technologies
• How the FOM photonR2R slot-die coater is built for multimodal studies targeted at industry and academia
• How FOM and DTI can benefit your thin film research—from experiment design to execution

The webinar includes three presentations:

• Revealing thin film structure during formation with synchrotron X‑ray diffraction
  Mathias Huss-Hansen, Danish Technological Institute
• FOM photonR2R slot-die coater for in-situ study of thin films
  Vladimir Popok, FOM Technologies
• Turning beam time into data: FOM’s unique proposition and a customer case.
  Nicholaj Asger Hansen, FOM Technologies